Research data supporting 'Weak localization and weak antilocalization in doped germanium epilayers'

摘要

This dataset contains raw txt files used to produce the figures in the article. These files therefore include measurements of three samples of doped germanium epilayers (two of which are n-type and one p-type) made at a range of temperatures. The samples were grown at the University of Warwick, processed at the University of Cambridge and measured in collaboration with Toshiba Research Europe Ltd.